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Research article summary (published 30 Dec 2002):

Predicting NCLEX-RN success: can it be simplified?

Full Abstract

The purpose of this study was to compare a simple, easily calculated method for predicting student success on the nursing licensure exam (NCLEX-RN) with more statistically complex methods of prediction. The Risk Appraisal Instrument (RAI), designed by Barkley, Rhodes, and Dufour (1), does not require sophisticated statistical methods, and the authors suggest it may be adapted for use in other nursing programs. We modified the RAI to suit the University of Delaware nursing program, and retroactively applied the Delaware RAI (DRAI) formula to the records of 538 students who graduated from our undergraduate baccalaureate nursing program between 1995 and 1998. Nearly 61 percent of NCLEX-RN failures were correctly classified, and 72 percent were accurately classified overall. While this more simple prediction might be helpful as a predictor of risk, it does not approach the 76 percent to 92 percent correct prediction of failure in recently published studies using statistically more complex methods.

 

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Author information

Author/s: Waterhouse, Julie Keith (JK); Beeman, Pamela B (PB);

Affiliation: Department of Nursing, College of Health and Nursing Sciences, University of Delaware, Newark, USA.

Journal and publication information

Publication Type: Comparative Study; Journal Article

Journal: Nursing education perspectives (Nurs Educ Perspect), published in United States. (Language: eng)

Reference: -2003 Jan-Feb; vol 24 (issue 1) : pp 35-9

Dates: Created 2003/04/04; Completed 2003/05/27; Revised 2006/11/15;

PMID: 12674919, status: MEDLINE (last retrieval date: 12/26/2008)

Sourced from the National Library of Medicine. Abstract text and other information may be subject to copyright.

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